The system is engineered for advanced research in electrochemistry, material science, polymer science, health and life sciences and biotechnology. PATLAB is equipped with an Agilent 5500 ideal multiple- user research system for atomic force microscopy (AFM) and scanning probe microscopy (SPM) with an electrochemical scanning microprobe microscopy (EC- SPM) to study the behaviour and kinetics of electrochemical micro- and nanoprobes in real time, Pico- TREC for simultaneous topography and recognition imaging with SPM for mapping target molecules on a sampling surface ideally suited for nanoelectrode sensor structuring and modifying, lithography and nanomanipulation with micro machining through force variations, nano patterning via probe bias and electrochemical etching, nano writing and nano modification via surface potential controlled deposition.
AGILENT 5500 SERIES ATOMIC FORCE MICROSCOPY (AFM)/SCANNING
